Information-theoretic and statistical methods of failure log selection for improved diagnosis. - Sarmad Tanwir; Sarvesh Prabhu; Michael S. Hsiao; Loganathan Lingappan (ITC, 2015)

Hardware-in-the-loop model-less diagnostic test generation. - Sarmad Tanwir; Michael S. Hsiao; Loganathan Lingappan (HLDVT, 2016)

A Test Pattern Quality Metric for Diagnosis of Multiple Stuck-at and Transition faults. - Sarmad Tanwir; Michael S. Hsiao; Loganathan Lingappan (ACM Great Lakes Symposium on VLSI, 2017)

An online framework for diagnosis of multiple defects in scan chains. - Sarmad Tanwir; Michael S. Hsiao; Loganathan Lingappan (ISQED, 2018)

Fast fault coverage estimation of sequential tests using entropy measurements. - Michael S. Hsiao; Sarmad Tanwir (VTS, 2018)