High temperature reliability of μtrench Phase-Change Memory devices. - Gabriele Navarro; Sarra Souiki; Alain Persico; Veronique Sousa; Jean-François Nodin; Carine Jahan; François Aussenac; Vincent Delaye; Olga Cueto; Luca Perniola; Barbara De Salvo (Microelectron. Reliab., 2012)

Analysis of the SET and RESET states drift of phase-change memories by low frequency noise measurements. - Sarra Souiki-Figuigui; Veronique Sousa; Gérard Ghibaudo; Gabriele Navarro; Martin Coué; Luca Perniola; P. Zuliani; Roberto Annunziata (IRPS, 2015)