Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. - Ramakrishna Voorakaranam; Sudip Chakrabarti; Junwei Hou; Alfred V. Gomes; Sasikumar Cherubal; Abhijit Chatterjee; William H. Kao (ITC, 1997)

Parametric Fault Diagnosis for Analog Systems Using Functional Mapping. - Sasikumar Cherubal; Abhijit Chatterjee (DATE, 1999)

A Methodology for Efficient Simulation and Diagnosis of Mixed-Signal Systems Using Error Waveforms. - Sasikumar Cherubal; Abhijit Chatterjee (DFT, 1999)

Test generation for fault isolation in analog circuits using behavioral models. - Sasikumar Cherubal; Abhijit Chatterjee (Asian Test Symposium, 2000)

Optimal INL/DNL testing of A/D converters using a linear model. - Sasikumar Cherubal; Abhijit Chatterjee (ITC, 2000)

An Efficient Hierarchical Fault Isolation Technique for Mixed-Signal Boards. - Sasikumar Cherubal; Abhijit Chatterjee (VLSI Design, 2000)

Test generation based diagnosis of device parameters for analog circuits. - Sasikumar Cherubal; Abhijit Chatterjee (DATE, 2001)

A high-resolution jitter measurement technique using ADC sampling. - Sasikumar Cherubal; Abhijit Chatterjee (ITC, 2001)

A Signature Test Framework for Rapid Production Testing of RF Circuits. - Ramakrishna Voorakaranam; Sasikumar Cherubal; Abhijit Chatterjee (DATE, 2002)

Prediction of analog performance parameters using fast transienttesting. - Pramodchandran N. Variyam; Sasikumar Cherubal; Abhijit Chatterjee (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)

Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. - Ramakrishna Voorakaranam; Randy Newby; Sasikumar Cherubal; Bob Cometta; Thomas Kuehl; David M. Majernik; Abhijit Chatterjee (ITC, 2003)

Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. - Ganesh Srinivasan; Soumendu Bhattacharya; Sasikumar Cherubal; Abhijit Chatterjee (DATE, 2004)

Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. - Soumendu Bhattacharya; Ganesh Srinivasan; Sasikumar Cherubal; Abhijit Chatterjee (DELTA, 2004)

Concurrent RF Test Using Optimized Modulated RF Stimuli. - Sasikumar Cherubal; Ramakrishna Voorakaranam; Abhijit Chatterjee; John McLaughlin; Jason L. Smith; David M. Majernik (VLSI Design, 2004)

System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. - Soumendu Bhattacharya; Ganesh Srinivasan; Sasikumar Cherubal; Achintya Halder; Abhijit Chatterjee (VTS, 2004)

Challenges in Next Generation Mixed-Signal IC Production Testing. - Sasikumar Cherubal (Asian Test Symposium, 2005)

Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. - Ganesh Srinivasan; Sasikumar Cherubal; Pramodchandran N. Variyam; Melese Teklu; C. P. Wang; David Guidry; Abhijit Chatterjee (ETS, 2005)

DIBPro: Automatic Diagnostic Program Generation Tool. - Venkat Kalyanaraman; Bruce C. Kim; Pramodchandran N. Variyam; Sasikumar Cherubal (ITC, 2006)

Signature Testing of Analog and RF Circuits: Algorithms and Methodology. - Ramakrishna Voorakaranam; Selim Sermet Akbay; Soumendu Bhattacharya; Sasikumar Cherubal; Abhijit Chatterjee (IEEE Trans. Circuits Syst. I Regul. Pap., 2007)

Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. - Ganesh Srinivasan; Abhijit Chatterjee; Sasikumar Cherubal; Pramodchandran N. Variyam (J. Electron. Test., 2010)