Power supply current monitoring techniques for testing PLLs. - Maneesha Dalmia; André Ivanov; Sassan Tabatabaei (Asian Test Symposium, 1997)

Testing for Floating Gates Defects in CMOS Circuits. - Sumbal Rafiq; André Ivanov; Sassan Tabatabaei; Michel Renovell (Asian Test Symposium, 1998)

A built-in current monitor for testing analog circuit blocks. - Sassan Tabatabaei; André Ivanov (ISCAS (2), 1999)

A Current Integrator for BIST of Mixed-Signal ICs. - Sassan Tabatabaei; André Ivanov (VTS, 1999)

Defect Oriented Testing of an ECL/CMOS Level Converter Circuit. - Min-Hsing P. Chen; André Ivanov; Sassan Tabatabaei (LATW, 2000)

An Embedded Core for Sub-Picosecond Timing Measurements. - Sassan Tabatabaei; André Ivanov (ITC, 2002)

Multi-GigaHertz Testing Challenges and Solutions. - Karim Arabi; Klaus-Dieter Hilliges; David C. Keezer; Sassan Tabatabaei (VTS, 2002)

Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? - Adam Osseiran; William De Wilkins; Barry Baril; Sassan Tabatabaei; Fidel Muradali; Ken Posse; Lee Song (VTS, 2002)

Embedded Timing Analysis: A SoC Infrastructure. - Sassan Tabatabaei; André Ivanov (IEEE Des. Test Comput., 2002)

Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-Offs for High-Speed Interconnect Device Testing. - Baosheng Wang; Yong B. Cho; Sassan Tabatabaei; André Ivanov (Asian Test Symposium, 2003)

An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. - Florence Azaïs; Yves Bertrand; Michel Renovell; André Ivanov; Sassan Tabatabaei (IEEE Des. Test Comput., 2003)

Jitter Models and Measurement Methods for High-Speed Serial Interconnects. - Andy Kuo; Touraj Farahmand; Nelson Ou; André Ivanov; Sassan Tabatabaei (ITC, 2004)

Jitter Generation and Measurement for Test of Multigbps Serial IO. - Sassan Tabatabaei; Michael Lee; Freddy Ben-Zeev (ITC, 2004)

Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects. - Nelson Ou; Touraj Farahmand; Andy Kuo; Sassan Tabatabaei; André Ivanov (IEEE Des. Test Comput., 2004)

A DDJ calibration methodology for high-speed test and measurement equipments. - Touraj Farahmand; Sassan Tabatabaei; Freddy Ben-Zeev; André Ivanov (ITC, 2005)

Jitter spectrum analysis using continuous time interval analyzer (CTIA). - Sassan Tabatabaei; Freddy Ben-Zeev; Touraj Farahmand (ITC, 2005)

A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices. - Baosheng Wang; Andy Kuo; Touraj Farahmand; André Ivanov; Yong B. Cho; Sassan Tabatabaei (J. Electron. Test., 2005)

Crosstalk bounded uncorrelated jitter (BUJ) for high-speed interconnects. - Andy Kuo; Roberto Rosales; Touraj Farahmand; Sassan Tabatabaei; André Ivanov (IEEE Trans. Instrum. Meas., 2005)

Design of a Tunable Differential Ring Oscillator With Short Start-Up and Switching Transients. - A. K. M. K. Mollah; Roberto Rosales; Sassan Tabatabaei; James Cicalo; André Ivanov (IEEE Trans. Circuits Syst. I Regul. Pap., 2007)

Silicon MEMS Oscillators for High-Speed Digital Systems. - Sassan Tabatabaei; Aaron Partridge (IEEE Micro, 2010)

A temperature-to-digital converter for a MEMS-based programmable oscillator with better than ±0.5ppm frequency stability. - Michael H. Perrott; Jim Salvia; Fred S. Lee; Aaron Partridge; Shouvik Mukherjee; Carl Arft; Jin-Tae Kim; Niveditha Arumugam; Pavan Gupta; Sassan Tabatabaei; Sudhakar Pamarti; Haechang Lee; et al. (ISSCC, 2012)

A Temperature-to-Digital Converter for a MEMS-Based Programmable Oscillator With < ±0.5-ppm Frequency Stability and < 1-ps Integrated Jitter. - Michael H. Perrott; James C. Salvia; Fred S. Lee; Aaron Partridge; Shouvik Mukherjee; Carl Arft; Jin-Tae Kim; Niveditha Arumugam; Pavan Gupta; Sassan Tabatabaei; Sudhakar Pamarti; Haechang Lee; et al. (IEEE J. Solid State Circuits, 2013)

11.1 Dual-MEMS-resonator temperature-to-digital converter with 40 K resolution and FOM of 0.12pJK2. - Meisam Heidarpour Roshan; Samira Zali Asl; Kimo Joo; Kamran Souri; Rajkumar Palwai; Lijun Will Chen; Sudhakar Pamarti; Joseph C. Doll; Nicholas Miller; Carl Arft; Sassan Tabatabaei; Carl Sechen; et al. (ISSCC, 2016)

A MEMS-Assisted Temperature Sensor With 20-µK Resolution, Conversion Rate of 200 S/s, and FOM of 0.04 pJK2. - Meisam Heidarpour Roshan; Samira Zaliasl; Kimo Joo; Kamran Souri; Rajkumar Palwai; Lijun Will Chen; Amanpreet Singh; Sudhakar Pamarti; Nicholas Miller; Joseph C. Doll; Carl Arft; Sassan Tabatabaei; et al. (IEEE J. Solid State Circuits, 2017)

3.7 A 620µW BJT-Based Temperature-to-Digital Converter with 0.65mK Resolution and FoM of 190fJ·K2. - Saleh Heidary Shalmany; Kamran Souri; Uaur Sonmez; Kianoush Souri; Michele D'Urbino; Said Hussaini; Darryl Tauro; Sassan Tabatabaei (ISSCC, 2020)