PinPoint: An algorithm for enhancing diagnostic resolution using capture cycle power information. - Seetal Potluri; Satya Trinadh; Roopashree Baskaran; Nitin Chandrachoodan; V. Kamakoti 001 (ETS, 2013)

LPScan: An algorithm for supply scaling and switching activity minimization during test. - Seetal Potluri; Satya Trinadh Adireddy; Chidhambaranathan Rajamanikkam; Shankar Balachandran (ICCD, 2013)

An Efficient Heuristic for Peak Capture Power Minimization During Scan-Based Test. - Satya Trinadh; Seetal Potluri; Ch. Sobhan Babu; V. Kamakoti 001 (J. Low Power Electron., 2013)

XStat: Statistical X-Filling Algorithm for Peak Capture Power Reduction in Scan Tests. - Satya Trinadh; Seetal Potluri; Shankar Balachandran; Ch. Sobhan Babu; V. Kamakoti 001 (J. Low Power Electron., 2014)

DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests. - Satya Trinadh; Ch. Sobhan Babu; Shiv Govind Singh; Seetal Potluri; V. Kamakoti 001 (DATE, 2015)

DFT Assisted Techniques for Peak Launch-to-Capture Power Reduction during Launch-On-Shift At-Speed Testing. - Seetal Potluri; Satya Trinadh; Ch. Sobhan Babu; V. Kamakoti 001; Nitin Chandrachoodan (ACM Trans. Design Autom. Electr. Syst., 2015)

Component fault localization using switching current measurements. - Seetal Potluri; Satya Trinadh; Siddhant Saraf; Kamakoti Veezhinathan (ETS, 2016)

Optimal Don't Care Filling for Minimizing Peak Toggles During At-Speed Stuck-At Testing. - Satya Trinadh Adireddy; Seetal Potluri; Ch. Sobhan Babu; Veezhinathan Kamakoti; Shiv Govind Singh (ACM Trans. Design Autom. Electr. Syst., 2017)