Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs. - Satyam Kumar 003; Tarun Samadder; Karansingh Thakor; Uma Sharma; Souvik Mahapatra (IRPS, 2021)

A Theoretical Framework for Trap Generation and Passivation in NAND Flash Tunnel Oxide During Distributed Cycling and Retention Bake. - Tarun Samadder; Satyam Kumar 003; Karansingh Thakor; Souvik Mahapatra (IRPS, 2021)