Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA. - Victor O. Costa; Fabio Benevenuti; Renan Menezes; Lidia Shibuya Sato; Luis Loures; Fernanda Lima Kastensmidt; Nemitala Added; Saulo G. Alberton; Vitor A. P. Aguiar; Nilberto H. Medina (LATS, 2024)

Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection. - Leonardo R. Gobatto; Fabio Benevenuti; Nemitala Added; Saulo G. Alberton; Eduardo L. A. Macchione; Vitor A. P. Aguiar; Nilberto H. Medina; Fernanda Lima Kastensmidt; José Rodrigo Azambuja (LATS, 2024)

On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments. - Saulo G. Alberton; Alexis C. Vilas Bôas; Jeffery Wyss; Vitor A. P. Aguiar; Matheus S. Pereira; Luca Silvestrin; Serena Mattiazzo; Alessandro Paccagnella; Carlo Cazzaniga; Maria Kastriotou; Christopher D. Frost; Nilberto H. Medina (IEEE Access, 2025)