Extreme Temperature (> 200 °C), Radiation Hard (> 1 Mrad), Dense (sub-50 nm CD), Fast (2 ns write pulses), Non-Volatile Memory Technology. - Saurabh V. Suryavanshi; Greg Yeric; Max Irby; X. M. Henry Huang; Glen Rosendale; Lucian Shifren (IMW, 2022)