Drift of Combinational Circuits Failure Rates with a Probabilistic Model Approximated by Partitioning. - Esther Goudet; Luis Peña Treviño; Gutemberg G. dos Santos Júnior; Sayah El Hajji; Fabio Sureau; Lirida Naviner; Jean-Marc Daveau; Philippe Roche (SBCCI, 2024)