Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs. - Bhawani Shankar; Ankit Soni; Sayak Dutta Gupta; Mayank Shrivastava (IRPS, 2018)

On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs. - Bhawani Shankar; Ankit Soni; Sayak Dutta Gupta; R. Sengupta; Heena Khand; N. Mohan; Srinivasan Raghavan 002; Mayank Shrivastava (IRPS, 2018)

UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities. - Sayak Dutta Gupta; Vipin Joshi; Bhawani Shankar; Swati Shikha; Srinivasan Raghavan 002; Mayank Shrivastava (IRPS, 2019)

On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs. - Sayak Dutta Gupta; Vipin Joshi; Rajarshi Roy Chaudhuri; Anant kr Singh; Sirsha Guha; Mayank Shrivastava (IRPS, 2020)

Unique Lattice Temperature Dependent Evolution of Hot Electron Distribution in GaN HEMTs on C-doped GaN Buffer and its Reliability Consequences. - Rajarshi Roy Chaudhuri; Vipin Joshi; Amratansh Gupta; Tanmay Joshi; Rasik Rashid Malik; Mehak Ashraf Mir; Sayak Dutta Gupta; Mayank Shrivastava (IRPS, 2023)

Unique Dependence of the Breakdown Behavior of Normally-OFF Cascode AlGaN/GaN HEMTs on Carrier Transport Through the Carbon-Doped GaN Buffer. - Vipin Joshi; Sayak Dutta Gupta; Rajarshi Roy Chaudhuri; Mayank Shrivastava (IRPS, 2023)

Observation of Kink effect in Carbon-doped GaN-on-Si HEMTs for Power Applications. - Pallavi Kumari; Sayak Dutta Gupta; Amitava DasGupta; Nandita DasGupta (IRPS, 2025)