Edge-Coupled Active and Passive Wafer-Scale Measurements on 300mm Silicon Photonics Wafers. - Kenneth M. Jabon; Christopher V. Poulton; Ren-Jye Shiue; Matthew J. Byrd; Zhan Su 001; Mohammad H. Teimourpour; Scott Breitenstein; Ronald P. Millman; Dogan A. Atlas; Michael R. Watts; Erman Timurdogan (OFC, 2021)