A network of dynamically microprogrammable machines. - Scott Davidson 001 (MICRO (1), 1975)

Testing of microprograms using the lockheed SUE microinstruction simulator. - Scott Davidson 001; William Tao (ANSS, 1976)

An Overview of Firmware Engineering. - Scott Davidson 001; Bruce D. Shriver (Computer, 1978)

Firmware Engineering - Firmware Engineering. - Bruce D. Shriver; Scott Davidson 001 (Firmware Engineering, 1980)

Local Microcode Compaction Techniques. - David Landskov; Scott Davidson 001; Bruce D. Shriver; Patrick W. Mallett (ACM Comput. Surv., 1980)

Specifying target resources in a machine independent higher level language. - Scott Davidson 001; Bruce D. Shriver (AFIPS National Computer Conference, 1981)

Some Experiments in Local Microcode Compaction for Horizontal Machines. - Scott Davidson 001; David Landskov; Bruce D. Shriver; Patrick W. Mallett (IEEE Trans. Computers, 1981)

Fault Simulation at the Architectural Level. - Scott Davidson 001 (ITC, 1984)

High level design automation tools (session overview). - Scott Davidson 001 (ACM Conference on Computer Science, 1985)

ESIM/AFS : A Concurrent Architectural Level Fault Simulator. - Scott Davidson 001; James L. Lewandowski (ITC, 1986)

Progress im High-Level Microprogramming. - Scott Davidson 001 (IEEE Softw., 1986)

Guest Editor's Introduction: Software Tools for Hardware Tests. - Scott Davidson 001 (Computer, 1989)

Is IDDQ Yield Loss Inevitable? - Scott Davidson 001 (ITC, 1994)

IDDQ Detection of CMOS Bridging Faults by Stuck-At Fault Tests. - Suntae Hwang; Rochit Rajsuman; Scott Davidson 001 (VLSI Design, 1994)

Base 1 logic: A method for environmentally friendly PC design. - Scott Davidson 001 (IEEE Des. Test Comput., 1996)

A test puzzle for a TGIF morning. - Scott Davidson 001 (IEEE Des. Test Comput., 1996)

How to achieve 95% fault coverage without really trying. - Scott Davidson 001 (IEEE Des. Test Comput., 1996)

George learns test. - Scott Davidson 001 (IEEE Des. Test Comput., 1997)

Why projects are late. - Scott Davidson 001 (IEEE Des. Test Comput., 1997)

ASIC jeopardy-diagnosing without a FAB. - Scott Davidson 001 (ITC, 1998)

Test Reuse at System Level. - José M. Miranda; Scott Davidson 001; Peter Dziel; Saman Adham; Steve Millman (VTS, 1998)

The Newer Colossus. - Scott Davidson 001 (IEEE Des. Test Comput., 1998)

Minutes Found on a Cave Wall. - Scott Davidson 001 (IEEE Des. Test Comput., 1998)

The Last Byte. - Scott Davidson 001 (IEEE Des. Test Comput., 1998)

Changing our Path to High Level ATPG. - Scott Davidson 001 (ITC, 1999)

ITC'99 Benchmark Circuits - Preliminary Results. - Scott Davidson 001 (ITC, 1999)

How Do I Boot Thee? Let Me Check Page 3. - Scott Davidson 001 (IEEE Des. Test Comput., 1999)

Twenty Years Ago Today. - Scott Davidson 001 (IEEE Des. Test Comput., 2000)

Testing in 2100. - Scott Davidson 001 (IEEE Des. Test Comput., 2000)

Guest Editors' Introduction: Benchmarking for Design and Test. - Scott Davidson 001; Justin E. Harlow III (IEEE Des. Test Comput., 2000)

ATPG for Design Errors-Is It Possible? - Magdy S. Abadir; Scott Davidson 001; Vijay Nagasamy; Dhiraj K. Pradhan; Prab Varma (VTS, 2001)

An Evaluation of Pseudo Random Testing for Detecting Real Defects. - Chao-Wen Tseng; Subhasish Mitra; Edward J. McCluskey; Scott Davidson 001 (VTS, 2001)

Welcome to 2001. - Scott Davidson 001 (IEEE Des. Test Comput., 2001)

What Can IC Test Teach System Test? - Scott Davidson 001 (ITC, 2002)

On Identifying Indistinguishable Path Delay Faults and Improving Diagnosis. - Ramesh C. Tekumalla; Scott Davidson 001 (ITC, 2002)

The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. - Michael G. Wahl; Sudipta Bhawmik; Kamran Zarrineh; Pradipta Ghosh; Scott Davidson 001; Peter Harrod (ITC, 2003)

All I Know I Learned at ITC. - Scott Davidson 001 (IEEE Des. Test Comput., 2003)

Paperless Design and Test. - Scott Davidson 001 (IEEE Des. Test Comput., 2004)

A practical look at ATPG. - Scott Davidson 001 (IEEE Des. Test Comput., 2004)

Open-source hardware. - Scott Davidson 001 (IEEE Des. Test Comput., 2004)

Design illiteracy. - Scott Davidson 001 (IEEE Des. Test Comput., 2004)

Understanding NTF components from the field. - Scott Davidson 001 (ITC, 2005)

The ITC test compression shootout. - Scott Davidson 001 (ITC, 2005)

Towards an Understanding of No Trouble Found Devices. - Scott Davidson 001 (VTS, 2005)

Testing: It's not just pass/fail anymore. - Scott Davidson 001 (IEEE Des. Test Comput., 2005)

BIST the hard way. - Scott Davidson 001 (IEEE Des. Test Comput., 2005)

What's the problem? - Scott Davidson 001 (IEEE Des. Test Comput., 2005)

Guest Editor's Introduction: ITC Examines How Test Helps the Fittest Survive. - Scott Davidson 001 (IEEE Des. Test Comput., 2005)

Behavioral Test Economics. - Scott Davidson 001; Anthony P. Ambler; Helen Davidson (ITC, 2006)

Searching for clues: Diagnosing IC failures. - Scott Davidson 001 (IEEE Des. Test Comput., 2006)

All about getting it. - Scott Davidson 001 (IEEE Des. Test Comput., 2006)

An insider's look at microprocessor design. - Scott Davidson 001 (IEEE Des. Test Comput., 2006)

Who Reads This Stuff Anyway? - Scott Davidson 001 (IEEE Des. Test Comput., 2006)

Book Reviews: A Comprehensive EDA Handbook. - Scott Davidson 001 (IEEE Des. Test Comput., 2006)

A laboratory right under your nose. - Scott Davidson 001 (IEEE Des. Test Comput., 2007)

A textbook with two target audiences. - Scott Davidson 001 (IEEE Des. Test Comput., 2007)

Losing control. - Scott Davidson 001 (IEEE Des. Test Comput., 2007)

How do we train today's students to become tomorrow's engineers? - Scott Davidson 001 (IEEE Des. Test Comput., 2007)

Book Reviews: Test Tutorials in Book Form. - Scott Davidson 001 (IEEE Des. Test Comput., 2007)

The Psychology of Electronic Test. - Scott Davidson 001; Helen Davidson (IEEE Des. Test Comput., 2007)

Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model. - Scott Davidson 001 (ITC, 2008)

How to make your own processor architecture. - Scott Davidson 001 (IEEE Des. Test Comput., 2008)

The commonality of vector generation techniques. - Scott Davidson 001 (IEEE Des. Test Comput., 2008)

With pick and shovel through our data. - Scott Davidson 001 (IEEE Des. Test Comput., 2008)

Guest Editors' Introduction: Progress in Test Compression. - Scott Davidson 001; Nur A. Touba (IEEE Des. Test Comput., 2008)

Using transition test to understand timing behavior of logic circuits on UltraSPARCTM T2 family. - Liang-Chi Chen; Paul Dickinson; Peter Dahlgren; Scott Davidson 001; Olivier Caty; Kevin Wu (ITC, 2009)

A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)]. - Scott Davidson 001 (IEEE Des. Test Comput., 2009)

Book Review: A book on system test, and testing systems also. - Scott Davidson 001 (IEEE Des. Test Comput., 2009)

Book Reviews: A guide for the wrapper perplexed. - Scott Davidson 001 (IEEE Des. Test Comput., 2009)

The Last Byte: Too many reboots. - Scott Davidson 001 (IEEE Des. Test Comput., 2009)

Concurrent checking for logic [review of "New Methods of Concurrent Checking (Goessel, M., et al; 2008)]. - Scott Davidson 001 (IEEE Des. Test Comput., 2010)

About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)]. - Scott Davidson 001 (IEEE Des. Test Comput., 2010)

Transition test bring-up and diagnosis on UltraSPARCTM processors. - Liang-Chi Chen; Peter Dahlgren; Paul Dickinson; Scott Davidson 001 (ITC, 2011)

All About Liquid Scan Chains - and More [review of "Digital Microfluidic Biochips: Design Automation and Optimization" (Chakrabarty, K. and Xu, T.; 2010)]. - Scott Davidson 001 (IEEE Des. Test Comput., 2011)

Testing high-frequency and low-power designs: Do the standard rules and tools apply? - Scott Davidson 001 (ITC, 2012)

Yield of Black Swans. - Scott Davidson 001 (IEEE Des. Test Comput., 2012)

A World Without Standards. - Scott Davidson 001 (IEEE Des. Test Comput., 2012)

At the beginning. - Scott Davidson 001 (IEEE Des. Test Comput., 2012)

Energy Efficiency Like Your Momma Used to Make. - Scott Davidson 001 (IEEE Des. Test Comput., 2012)

Planned Unobsolescence. - Scott Davidson 001 (IEEE Des. Test, 2013)

50 Years of DAC Moments. - Scott Davidson 001 (IEEE Des. Test, 2014)

Hey, you, get onna my cloud [The Last Byte]. - Scott Davidson 001 (IEEE Des. Test, 2014)

A Truly Wireless Future? - Scott Davidson 001 (IEEE Des. Test, 2014)

Getting Credit. - Scott Davidson 001 (IEEE Des. Test, 2015)

Time Out of Mind. - Scott Davidson 001 (IEEE Des. Test, 2015)

A 3-D Forward into the Past. - Scott Davidson 001 (IEEE Des. Test, 2015)

Chips That Do Things. - Scott Davidson 001 (IEEE Des. Test, 2015)

Good Enough Computing. - Scott Davidson 001 (IEEE Des. Test, 2016)

The Five Stages of Project Grief. - Scott Davidson 001 (IEEE Des. Test, 2016)

And He Built a Crooked Chip. - Scott Davidson 001 (IEEE Des. Test, 2016)

The Intestinal Superhighway. - Scott Davidson 001 (IEEE Des. Test, 2016)

Where Are We Going? - Scott Davidson 001 (IEEE Des. Test, 2016)

Research Is Its Own Reward. - Scott Davidson 001 (IEEE Des. Test, 2017)

Dark Silicon, Antiparallelism, and Too Much Work. - Scott Davidson 001 (IEEE Des. Test, 2017)

Cyber-Physical System Design With Sensor Networking Technologies. - Scott Davidson 001 (IEEE Des. Test, 2017)

Being Connected. - Scott Davidson 001 (IEEE Des. Test, 2017)

Practice Makes Perfect. - Scott Davidson 001 (IEEE Des. Test, 2017)

Engineering Secure Internet of Things Systems. - Scott Davidson 001 (IEEE Des. Test, 2017)

To Verification Infinity and Beyond. - Scott Davidson 001 (IEEE Des. Test, 2017)

Chips Thinking About Chips. - Scott Davidson 001 (IEEE Des. Test, 2017)

Technobabble. - Scott Davidson 001 (IEEE Des. Test, 2018)

The Last Byte: Real Time, Real People. - Scott Davidson 001 (IEEE Des. Test, 2018)

Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology and Electronic Design Automation for IC System Design, Verification, and Testing. - Scott Davidson 001 (IEEE Des. Test, 2018)

Computers with Tailfins? - Scott Davidson 001 (IEEE Des. Test, 2018)

The Joy of Scheduling. - Scott Davidson 001 (IEEE Des. Test, 2018)

Self-Test and Self-Aware. - Scott Davidson 001 (IEEE Des. Test, 2018)

Running on Empty. - Scott Davidson 001 (IEEE Des. Test, 2018)

Is This a System? - Scott Davidson 001 (IEEE Des. Test, 2019)

The Last Byte: I Have Met the IoT Security Enemy and He Is Us. - Scott Davidson 001 (IEEE Des. Test, 2019)

The Last Byte: System Testing Ourselves. - Scott Davidson 001 (IEEE Des. Test, 2019)

The Last Byte: IoT and That Nagging Feeling. - Scott Davidson 001 (IEEE Des. Test, 2019)

The Last Byte: The Internet of People. - Scott Davidson 001 (IEEE Des. Test, 2019)

The Last Byte: Big Data, Big Faults. - Scott Davidson 001 (IEEE Des. Test, 2020)

The Last Byte: Are You Sure You Love That Store? - Scott Davidson 001 (IEEE Des. Test, 2020)

The Last Byte: 3-D TV? We Got 6-D TV! - Scott Davidson 001 (IEEE Des. Test, 2020)

My Friendly Orange Glow. - Scott Davidson 001 (IEEE Des. Test, 2020)

Transitional Phones. - Scott Davidson 001 (IEEE Des. Test, 2020)

Too Many Cooks Make the Product. - Scott Davidson 001 (IEEE Des. Test, 2020)

Hacking in the Dark. - Scott Davidson 001 (IEEE Des. Test, 2021)

The Road to Open-Source EDA. - Scott Davidson 001 (IEEE Des. Test, 2021)

Security Begins at Home. - Scott Davidson 001 (IEEE Des. Test, 2021)

Being Learned. - Scott Davidson 001 (IEEE Des. Test, 2021)

Bad Design Inside of You. - Scott Davidson 001 (IEEE Des. Test, 2021)

Computing in the Real World. - Scott Davidson 001 (IEEE Des. Test, 2021)

25 Years (and a Bit More) of The Last Byte. - Scott Davidson 001 (IEEE Des. Test, 2022)

The Memory Shuffle. - Scott Davidson 001 (IEEE Des. Test, 2022)

Benchmarking Benchmarking. - Scott Davidson 001 (IEEE Des. Test, 2022)

Security Arms Race. - Scott Davidson 001 (IEEE Des. Test, 2022)

Standing on the Shoulders of ... - Scott Davidson 001 (IEEE Des. Test, 2022)

Small Is Good. - Scott Davidson 001 (IEEE Des. Test, 2022)

Training Data Sets: The Source of Our Woes? - Scott Davidson 001 (IEEE Des. Test, 2023)

Is There an Answer? - Scott Davidson 001 (IEEE Des. Test, 2023)

Our Gated Community. - Scott Davidson 001 (IEEE Des. Test, 2023)

Calling Yourself Back. - Scott Davidson 001 (IEEE Des. Test, 2023)

Predictions. - Scott Davidson 001 (IEEE Des. Test, 2024)

Losing My Memory. - Scott Davidson 001 (IEEE Des. Test, 2024)

Niklaus Wirth (1934-2024) - An Appreciation. - Scott Davidson 001 (IEEE Des. Test, 2024)

IC Phone Home! - Scott Davidson 001 (IEEE Des. Test, 2024)

Attack of the AI Papers. - Scott Davidson 001 (IEEE Des. Test, 2024)

The Joys of Open-Source Hardware. - Scott Davidson 001 (IEEE Des. Test, 2024)

This Stuff Is Great - Am I Right? - Scott Davidson 001 (IEEE Des. Test, 2025)

Getting to Know All About Us. - Scott Davidson 001 (IEEE Des. Test, 2025)

Reliability for the Masses. - Scott Davidson 001 (IEEE Des. Test, 2025)

Stored Programs Restored. - Scott Davidson 001 (IEEE Des. Test, 2025)