Understanding pulsed-cycling variability and endurance in HfOx RRAM. - Simone Balatti; Stefano Ambrogio; Zhongqiang Wang; Scott Sills; Alessandro Calderoni; Nirmal Ramaswamy; Daniele Ielmini (IRPS, 2015)

Challenges for high-density 16Gb ReRAM with 27nm technology. - Scott Sills; Shuichiro Yasuda; Alessandro Calderoni; Christopher Cardon; Jonathan Strand; Katsuhisa Aratani; Nirmal Ramaswamy (VLSIC, 2015)