On-chip I-V variability and random telegraph noise characterization in 28 nm CMOS. - Amy Whitcombe; Scott Taylor; Martin Denham; Vladimir M. Milovanovic; Borivoje Nikolic (ESSDERC, 2016)

Bootstrap percolation via automated conjecturing. - Neal Bushaw; Blake Conka; Vinay Gupta; Aidan Kierans; Hudson Lafayette; Craig E. Larson; Kevin McCall; Andriy Mulyar; Christine Sullivan; Scott Taylor; Evan Wainright; Evan Wilson; et al. (Ars Math. Contemp., 2023)