Hot electron induced punchthrough voltage of p-channel SOI MOSFET's at room and elevated temperatures. - Se Re Na Yun; Won Sub Park; Byung Ha Lee; Jong Tae Park 003 (Microelectron. Reliab., 2003)

Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's. - Se Re Na Yun; Chong-Gun Yu; Seok Hee Jeon; Chungkyue Kim; Jong Tae Park 003; Jean-Pierre Colinge (Microelectron. Reliab., 2004)

New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors. - In Kyung Lee; Se Re Na Yun; Kyosun Kim; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2006)