Degradation dynamics, recovery, and characterization of negative bias temperature instability. - Maxim Ershov; Sharad Saxena; Sean Minehane; P. Clifton; Mark Redford; R. Lindley; H. Karbasi; S. Graves; S. Winters (Microelectron. Reliab., 2005)

Application-specific worst case corners using response surfaces and statistical models. - Manidip Sengupta; Sharad Saxena; Lidia Daldoss; Glen Kramer; Sean Minehane; Jianjun Cheng (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005)

An efficient control variates method for yield estimation of analog circuits based on a local model. - Pierre-Francois Desrumaux; Yoan Dupret; Jens Tingleff; Sean Minehane; Mark Redford; Laurent Latorre; Pascal Nouet (ICCAD, 2012)