Intrinsic stress fracture energy measurements for PECVD thin films in the SiOxCyNz: H system. - Sean W. King; J. A. Gradner (Microelectron. Reliab., 2009)

Mechanical stress field assisted charge de-trapping in carbon doped oxides. - M. T. Alam; K. E. Maletto; J. Bielefeld; Sean W. King; M. Aman Haque (Microelectron. Reliab., 2015)

Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability. - Michael J. Mutch; Thomas Pomorski; Brad C. Bittel; Corey J. Cochrane; Patrick M. Lenahan; Xin Liu; Robert J. Nemanich; Justin Brockman; Marc French; Markus Kuhn; Benjamin French; Sean W. King (Microelectron. Reliab., 2016)

Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics. - Patrick M. Lenahan; E. B. Frantz; Sean W. King; Mark A. Anders 002; S. J. Moxim; James P. Ashton; Kyle J. Myers; M. E. Flatté; N. J. Harmon (IRPS, 2023)