Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks. - Fernando L. Aguirre; Sebastián Matías Pazos; Felix Palumbo; Sivan Fadida; Roy Winter; Moshe Eizenberg (IRPS, 2018)

Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp. - Andrés Fontana; Sebastián Matías Pazos; Fernando L. Aguirre; Felix Palumbo; Nahuel Vega; Nahuel A. Müller; Emanuel de la Fourniere; Mario Debray (SBCCI, 2018)

Performance-reliability trade-offs in short range RF power amplifier design. - Sebastián Matías Pazos; Fernando L. Aguirre; Felix Palumbo; Fernando Silveira (Microelectron. Reliab., 2018)

Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms. - Fernando Leonel Aguirre; Andrea Padovani; Alok Ranjan 001; Nagarajan Raghavan; Nahuel Vega; Nahuel Muller; Sebastián Matías Pazos; Mario Debray; Joel Molina Reyes; Kin Leong Pey; Felix Palumbo (IRPS, 2019)

Application of the Quasi-Static Memdiode Model in Cross-Point Arrays for Large Dataset Pattern Recognition. - Fernando Leonel Aguirre; Sebastián Matías Pazos; Felix Palumbo; Jordi Suñé; Enrique Miranda 002 (IEEE Access, 2020)

Line Resistance Impact in Memristor-based Multi Layer Perceptron for Pattern Recognition. - Fernando L. Aguirre; Sebastián Matías Pazos; Felix Palumbo; N. Gomez; Enrique Miranda 002; Jordi Suñé (LASCAS, 2021)