Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions. - Ayse Sünbül; Tarek Ali; Raik Hoffmann; Ricardo Revello; Yannick Raffel; Pardeep Duhan; David Lehninger; Kati Kühnel; Matthias Rudolph; Sebastian Oehler; Philipp Schramm; Malte Czernohorsky; et al. (IRPS, 2022)