Yield optimization using advanced statistical correlation methods. - Jeff Tikkanen; Sebastian Siatkowski; Nik Sumikawa; Li-C. Wang; Magdy S. Abadir (ITC, 2014)

Generalization of an outlier model into a "global" perspective. - Sebastian Siatkowski; Chia-Ling Chang; Li-C. Wang; Nikolas Sumikawa; LeRoy Winemberg; W. Robert Daasch (ITC, 2015)

Consistency in wafer based outlier screening. - Sebastian Siatkowski; Chuanhe Jay Shan; Li-C. Wang; Nikolas Sumikawa; W. Robert Daasch; John M. Carulli (VTS, 2016)

Feature extraction from design documents to enable rule learning for improving assertion coverage. - Kuo-Kai Hsieh; Sebastian Siatkowski; Li-C. Wang; Wen Chen 016; Jayanta Bhadra (ASP-DAC, 2017)

Some considerations on choosing an outlier method for automotive product lines. - Li-C. Wang; Sebastian Siatkowski; Chuanhe Jay Shan; Matthew Nero; Nikolas Sumikawa; LeRoy Winemberg (ITC, 2017)

Learning the process for correlation analysis. - Sebastian Siatkowski; Li-C. Wang; Nik Sumikawa; LeRoy Winemberg (VTS, 2017)

Data Analytics in Test: Recognizing and Reducing Subjectivity - Sebastian Siatkowski (2017)