Accelerated reliability testing of flash memory: Accuracy and issues on a 45nm NOR technology. - Marcello Calabrese; Carmine Miccoli; Christian Monzio Compagnoni; Luca Chiavarone; Silvia Beltrami; Andrea Parisi; Sebastiano Bartolone; Andrea L. Lacaita; Alessandro S. Spinelli; Angelo Visconti (ICICDT, 2013)