Fast thermal fatigue on top metal layer of power devices. - Sebastiano Russo; Romeo Letor; Orazio Viscuso; Lucia Torrisi; Gianluigi Vitali (Microelectron. Reliab., 2002)

Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. - Andrea Irace; Giovanni Breglio; Paolo Spirito; Romeo Letor; Sebastiano Russo (Microelectron. Reliab., 2005)

Reliability of planar, Super-Junction and trench low voltage power MOSFETs. - Antonio Testa; Salvatore De Caro; Saverio Panarello; Salvatore Patanè; Sebastiano Russo; D. Patti; S. Poma; Romeo Letor (Microelectron. Reliab., 2010)

High temperature long term stability of SiC Schottky diodes. - Antonio Testa; Salvatore De Caro; Sebastiano Russo; D. Patti; Lucia Torrisi (Microelectron. Reliab., 2011)

NORA based TDC in 90 nm CMOS. - Nicola Petra; Sebastiano Russo; Davide De Caro; Ettore Napoli; Giancarlo Barbarino; Antonio G. M. Strollo (Microelectron. J., 2013)

Numerical approach to predict power device reliability. - Alessandro Sitta; Sebastiano Russo; Gaetano Bazzano; Daniela Cavallaro; Giuseppe Greco 002; Michele Calabretta (DTIS, 2018)

Fast transient thermomechanical stress to set a pressure-assisted sintering process. - Marco Santopá; Sebastiano Russo; Marco Torrisi; Marco Renna; Alessandro Sitta; Michele Calabretta (PRIME, 2019)

Power Cycling Body Diode Current Flow on SiC MOSFET Device. - Giovanni Corrente; Nella Bentivegna; Sebastiano Russo (IOLTS, 2022)

A New Analytical Approach to Flutter Analysis in Long-span Suspension Bridges. - Sebastiano Russo (2024)