Laser diode COFD analysis by thermoreflectance microscopy. - Stefan Dilhaire; Stéphane Grauby; Sébastien Jorez; Luis David Patiño Lopez; Emmanuel Schaub; Wilfrid Claeys (Microelectron. Reliab., 2001)

Strain energy imaging of a power MOS transistor using speckle interferometry. - Stefan Dilhaire; Stéphane Grauby; Sébastien Jorez; Wilfrid Claeys (IEEE Trans. Reliab., 2004)