Strained silicon on insulator substrates for fully depleted application. - Walter Schwarzenbach; N. Daval; S. Kerdilès; G. Chabanne; C. Figuet; S. Guerroudj; O. Bonnin; X. Cauchy; Bich-Yen Nguyen; Christophe Maleville (ICICDT, 2012)

Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability. - Tarek Ali; Ricardo Olivo; S. Kerdilès; David Lehninger; Maximilian Lederer; Sourav De 002; A.-S. Royet; Ayse Sünbül; A. Prabhu; Kati Kühnel; Malte Czernohorsky; M. Rudolph; et al. (IMW, 2022)

Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited). - Laurent Grenouillet; Justine Barbot; J. Laguerre; Simon Martin 006; Catherine Carabasse; M. Louro; Messaoud Bedjaoui; S. Minoret; S. Kerdilès; C. Boixaderas; Thomas Magis; Carine Jahan; et al. (IRPS, 2023)

Breakthrough Processes for Si CMOS Devices with BEOL Compatibility for 3D Sequential Integrated more than Moore Analog Applications. - Daphnée Bosch; Abygaël Viey; Tadeu Mota Frutuoso; P. Lheritier; C. Licitra; Nada Zerhouni; A. Albouy; Laurent Brunet; A. Magalhaes-Lucas; L. M. B. da Silva; H. Boutry; M. Husien Fahmy Taha Abdelrahman; et al. (VLSI Technology and Circuits, 2024)

Enhanced Ferroelectricity in Hf0.5Zr.5O2 Thin Films by NLA at Intermediate Laser Energy Density. - David Lehninger; Tianren Zhang; Peter Reinig; Justine Barbot; Mathieu Opprecht; Sébastien Kerdilès; Laurent Grenouillet; Konrad Seidel; Maximilian Lederer (ICICDT, 2025)