Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process. - Célestin Doyen; Stéphane Ricq; Pierre Magnan; Olivier Marcelot; Marios Barlas; Sébastien Place (Sensors, 2020)

Design Techniques Evaluation to Mitigate RTS Noise Effect in Column ADC of 3D Stacked Image Sensors. - M. Gouveia da Cunha; Sébastien Place; O. Gauthier; N. Virollet; M. Vignetti; Philippe Martin-Gonthier; Pierre Magnan; Vincent Goiffon (IRPS, 2024)