Reliability of STT-MRAM for various embedded applications. - Shinhee Han; Junghyuk Lee; Kiseok Suh; Kyungtae Nam; Daeeun Jeong; Sechung Oh; Sohee Hwang; Yongsung Ji; Kilho Lee; Kangho Lee; Yoonjong Song; Yeongki Hong; et al. (IRPS, 2021)

Highly Scalable Vertical Bypass RRAM (VB-RRAM) for 3D V -NAND Memory. - Geonhui Han; Youngdong Kim; Jaeseon Kim; Dongmin Kim; Yoori Seo; Chuljun Lee; Jinmyung Choi; Jinwoo Lee; Dongho Ahn; Sechung Oh; Donghwa Lee; Hyunsang Hwang (VLSI Technology and Circuits, 2024)