Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. - Sehun Kook; Hyun Woo Choi; Vishwanath Natarajan; Abhijit Chatterjee; Alfred V. Gomes; Shalabh Goyal; Le Jin (Asian Test Symposium, 2009)

Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. - Sehun Kook; Vishwanath Natarajan; Abhijit Chatterjee; Shalabh Goyal; Le Jin (ETS, 2009)

Signature Testing and Diagnosis of High Precision S? ADC Dynamic Specifications Using Model Parameter Estimation. - Sehun Kook; Aritra Banerjee; Abhijit Chatterjee (ETS, 2011)

Dynamic Specification Testing and Diagnosis of High-Precision Sigma-Delta ADCs. - Sehun Kook; Aritra Banerjee; Abhijit Chatterjee (IEEE Des. Test, 2013)

Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements. - Sehun Kook; Hyun Woo Choi; Abhijit Chatterjee (IEEE Trans. Very Large Scale Integr. Syst., 2013)