A Study on Yield Analysis Method Using Classifiers for Semiconductor Manufacturing. - Seima Sakaguchi; Yasushi Arimura; Takayuki Yamauchi; Yuichi Tokuyama; Tomoya Kawai; Hidetaka Eguchi; Hiroyuki Morinaga; Hiroharu Kawanaka; Tetsushi Wakabayashi (SCIS/ISIS, 2022)