Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. - Kihyuk Han; Joonsung Park; Jae Wook Lee; Jacob A. Abraham; Eonjo Byun; Cheol-Jong Woo; Sejang Oh (ETS, 2009)

At-speed Test of High-Speed DUT Using Built-Off Test Interface. - Joonsung Park; Jae Wook Lee; Jaeyong Chung; Kihyuk Han; Jacob A. Abraham; Eonjo Byun; Cheol-Jong Woo; Sejang Oh (Asian Test Symposium, 2010)

Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. - Kihyuk Han; Joonsung Park; Jae Wook Lee; Jaeyong Chung; Eonjo Byun; Cheol-Jong Woo; Sejang Oh; Jacob A. Abraham (J. Electron. Test., 2011)