Potentiality of trap charge effects and SiON induced interface defects in a-Si3N4/SiON based MIS structure for resistive NVM device. - Syed Mukulika Dinara; Saptarsi Ghosh; Nripendra N. Halder; Ankush Bag; Sekhar Bhattacharya; Dhrubes Biswas (Microelectron. Reliab., 2015)