Comparison of contactless measurement and testing techniques to a all-silicon optical test and characterization method. - Selahattin Sayil; David V. Kerns Jr.; Sherra E. Kerns (IEEE Trans. Instrum. Meas., 2005)

Optical Contactless Probing: An All-Silicon, Fully Optical Approach. - Selahattin Sayil (IEEE Des. Test Comput., 2006)

Single Event crosstalk shielding for CMOS logic. - Selahattin Sayil; Abhishek B. Akkur; Nelson Gaspard III (Microelectron. J., 2009)

Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits. - Selahattin Sayil; Sumanth R. Yeddula; Juyu Wang (IEEE Des. Test, 2013)

Modeling single event crosstalk speedup in nanometer technologies. - Selahattin Sayil; Li Yuan 004 (Microelectron. J., 2015)

Soft Error Mitigation Using Transmission Gate With Varying Gate and Body Bias. - Selahattin Sayil; Archit H. Shah; Md. Adnan Zaman; Mohammad A. Islam 001 (IEEE Des. Test, 2017)

Coupling Noise Mitigation using a Pass Transistor. - Selahattin Sayil; Subed Lamichhane; Kutay Sayil (ISVLSI, 2020)

Creating Engaged and Active Learning Through Collaborative Online Lab Experiences. - Selahattin Sayil; Julia Yoo; Gleb V. Tcheslavski (FIE, 2022)

Online Electrical Engineering Labs with Collaborative Open-Ended Assignments. - Selahattin Sayil; Gleb V. Tcheslavski; Julia Yoo; Yuyao Wang (FIE, 2023)