Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference. - Selim Sermet Akbay; Abhijit Chatterjee (VTS, 2004)

On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). - Donghoon Han; Selim Sermet Akbay; Soumendu Bhattacharya; Abhijit Chatterjee; William R. Eisenstadt (IOLTS, 2005)

Built-In Test of RF Components Using Mapped Feature Extraction Sensors. - Selim Sermet Akbay; Abhijit Chatterjee (VTS, 2005)

Alternate Test of RF Front Ends with IP Constraints: Frequency Domain Test Generation and Validation. - Selim Sermet Akbay; Jose L. Torres; Julie M. Rumer; Abhijit Chatterjee; Joel Amtsfield (ITC, 2006)

Testing RF Components with Supply Current Signatures. - Selim Sermet Akbay; Shreyas Sen; Abhijit Chatterjee (ATS, 2007)

Fault-based alternate test of RF components. - Selim Sermet Akbay; Abhijit Chatterjee (ICCD, 2007)

Signature Testing of Analog and RF Circuits: Algorithms and Methodology. - Ramakrishna Voorakaranam; Selim Sermet Akbay; Soumendu Bhattacharya; Sasikumar Cherubal; Abhijit Chatterjee (IEEE Trans. Circuits Syst. I Regul. Pap., 2007)

Constraint-driven RF test stimulus generation and built-in test. - Selim Sermet Akbay (2009)