A Systematic Approach for Designing Testable VLSI Circuits. - Sen-Pin Lin; Charles Njinda; Melvin A. Breuer (ICCAD, 1991)

Generating a family of testable designs using the BILBO methodology. - Sen-Pin Lin; Charles Njinda; Melvin A. Breuer (J. Electron. Test., 1993)

A Low Cost BIST Methodology and Associated Novel Test Pattern Generator. - Sen-Pin Lin; Sandeep K. Gupta 001; Melvin A. Breuer (EDAC-ETC-EUROASIC, 1994)