Technology variability from a design perspective. - Borivoje Nikolic; Bastien Giraud; Zheng Guo; Liang-Teck Pang; Ji-Hoon Park; Seng Oon Toh (CICC, 2010)

Parameter-specific ring oscillator for process monitoring at the 45 nm node. - Lynn T.-N. Wang; Nuo Xu; Seng Oon Toh; Andrew R. Neureuther; Tsu-Jae King Liu; Borivoje Nikolic (CICC, 2010)

SRAM stability characterization using tunable ring oscillators in 45nm CMOS. - Jason Tsai; Seng Oon Toh; Zheng Guo; Liang-Teck Pang; Tsu-Jae King Liu; Borivoje Nikolic (ISSCC, 2010)

Characterization of Dynamic SRAM Stability in 45 nm CMOS. - Seng Oon Toh; Zheng Guo; Tsu-Jae King Liu; Borivoje Nikolic (IEEE J. Solid State Circuits, 2011)

Technology Variability From a Design Perspective. - Borivoje Nikolic; Ji-Hoon Park; Jaehwa Kwak; Bastien Giraud; Zheng Guo; Liang-Teck Pang; Seng Oon Toh; Ruzica Jevtic; Kun Qian 014; Costas J. Spanos (IEEE Trans. Circuits Syst. I Regul. Pap., 2011)

SRAM Assist Techniques for Operation in a Wide Voltage Range in 28-nm CMOS. - Brian Zimmer; Seng Oon Toh; Huy Vo; Yunsup Lee; Olivier Thomas; Krste Asanovic; Borivoje Nikolic (IEEE Trans. Circuits Syst. II Express Briefs, 2012)

Joint impact of random variations and RTN on dynamic writeability in 28nm bulk and FDSOI SRAM. - Brian Zimmer; Olivier Thomas; Seng Oon Toh; Taylor Vincent; Krste Asanovic; Borivoje Nikolic (ESSDERC, 2014)