Performance entitlement by exploiting transistor's BTI recovery. - Senthil Arasu; Mehrdad Nourani; Vijay Reddy; John M. Carulli (ISQED, 2013)

A design-for-reliability approach based on grading library cells for aging effects. - Senthil Arasu; Mehrdad Nourani; John M. Carulli; Kenneth M. Butler; Vijay Reddy (ITC, 2013)

Asymmetric aging of clock networks in power efficient designs. - Senthil Arasu; Mehrdad Nourani; Frank Cano; John M. Carulli; Vijay Reddy (ISQED, 2014)

Reliability improvement of logic and clock paths in power-efficient designs. - Senthil Arasu; Mehrdad Nourani; Vijay Reddy; John M. Carulli Jr.; Gautam Kapila; Min Chen 024 (ACM J. Emerg. Technol. Comput. Syst., 2014)

Controlling Aging in Timing-Critical Paths. - Senthil Arasu; Mehrdad Nourani; John M. Carulli; Vijay Reddy (IEEE Des. Test, 2016)