Increased hot carrier effects in Gate-All-Around SOI nMOSFET's. - Jong Tae Park 003; Nag Jong Choi; Chong-Gun Yu; Seok Hee Jeon; Jean-Pierre Colinge (Microelectron. Reliab., 2003)

Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's. - Se Re Na Yun; Chong-Gun Yu; Seok Hee Jeon; Chungkyue Kim; Jong Tae Park 003; Jean-Pierre Colinge (Microelectron. Reliab., 2004)

Reliability improvement by the suppression of keyhole generation in W-plug vias. - Jong Hun Kim; Kyosun Kim; Seok Hee Jeon; Jong Tae Park 003 (Microelectron. Reliab., 2005)