A 1.2 V 20 nm 307 GB/s HBM DRAM With At-Speed Wafer-Level IO Test Scheme and Adaptive Refresh Considering Temperature Distribution. - Kyomin Sohn; Won-Joo Yun; Reum Oh; Chi-Sung Oh; Seong-Young Seo; Min-Sang Park; Dong-Hak Shin; Won-Chang Jung; Sang-Hoon Shin; Je-Min Ryu; Hye-Seung Yu; Jae-Hun Jung; et al. (IEEE J. Solid State Circuits, 2017)

An Enhanced Built-off-Test Transceiver with Wide-range, Self-calibration Engine for 3.2 Gb/s/pin DDR4 SDRAM. - Joung-Wook Moon; Hye-Sung Yoo; Hundai Choi; Il-Won Park; Seok-Yong Kang; Jun-Bae Kim; Haeyoung Chung; Kiho Kim; Dong-Hun Lee; Ki-Jae Song; Seok-Hun Hyun; Indal Song; et al. (A-SSCC, 2018)