Seokho Kang

Orcid: 0000-0002-0960-0294

Affiliations:
  • Sungkyunkwan University, Suwon, Korea


According to our database1, Seokho Kang authored at least 54 papers between 2014 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

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Bibliography

2024
Improving chemical reaction yield prediction using pre-trained graph neural networks.
J. Cheminformatics, December, 2024

Photovoltaic Cell Defect Detection Based on Weakly Supervised Learning With Module-Level Annotations.
IEEE Access, 2024

2023
Learning from single-defect wafer maps to classify mixed-defect wafer maps.
Expert Syst. Appl., December, 2023

Optimization of missing value imputation for neural networks.
Inf. Sci., November, 2023

Supervised contrastive learning for wafer map pattern classification.
Eng. Appl. Artif. Intell., November, 2023

Surrogate approach to uncertainty quantification of neural networks for regression.
Appl. Soft Comput., May, 2023

Semi-supervised rotation-invariant representation learning for wafer map pattern analysis.
Eng. Appl. Artif. Intell., April, 2023

Efficient improvement of classification accuracy via selective test-time augmentation.
Inf. Sci., 2023

Class-Adaptive Data Augmentation for Image Classification.
IEEE Access, 2023

2022
Generative Modeling to Predict Multiple Suitable Conditions for Chemical Reactions.
J. Chem. Inf. Model., 2022

Uncertainty-aware prediction of chemical reaction yields with graph neural networks.
J. Cheminformatics, 2022

ADANOISE: Training neural networks with adaptive noise for imbalanced data classification.
Expert Syst. Appl., 2022

Using binary classifiers for one-class classification.
Expert Syst. Appl., 2022

Dynamic imputation for improved training of neural network with missing values.
Expert Syst. Appl., 2022

Domain-adaptive active learning for cost-effective virtual metrology modeling.
Comput. Ind., 2022

Semi-automatic wafer map pattern classification with convolutional neural networks.
Comput. Ind. Eng., 2022

2021
Product failure prediction with missing data using graph neural networks.
Neural Comput. Appl., 2021

Active learning with missing values considering imputation uncertainty.
Knowl. Based Syst., 2021

MI-MOTE: Multiple imputation-based minority oversampling technique for imbalanced and incomplete data classification.
Inf. Sci., 2021

Active cluster annotation for wafer map pattern classification in semiconductor manufacturing.
Expert Syst. Appl., 2021

Data-free knowledge distillation in neural networks for regression.
Expert Syst. Appl., 2021

A stacking ensemble classifier with handcrafted and convolutional features for wafer map pattern classification.
Comput. Ind., 2021

Model-Agnostic Post-Processing Based on Recursive Feedback for Medical Image Segmentation.
IEEE Access, 2021

2020
Joint modeling of classification and regression for improving faulty wafer detection in semiconductor manufacturing.
J. Intell. Manuf., 2020

Neural Message Passing for NMR Chemical Shift Prediction.
J. Chem. Inf. Model., 2020

Predictive Modeling of NMR Chemical Shifts without Using Atomic-Level Annotations.
J. Chem. Inf. Model., 2020

Compressed graph representation for scalable molecular graph generation.
J. Cheminformatics, 2020

Expected margin-based pattern selection for support vector machines.
Expert Syst. Appl., 2020

Model validation failure in class imbalance problems.
Expert Syst. Appl., 2020

Rotation-Invariant Wafer Map Pattern Classification With Convolutional Neural Networks.
IEEE Access, 2020

Unsupervised Anomaly Detection Using Style Distillation.
IEEE Access, 2020

Kernel Rotation Forests for Classification.
Proceedings of the 2020 IEEE International Conference on Big Data and Smart Computing, 2020

2019
Clustering-based proxy measure for optimizing one-class classifiers.
Pattern Recognit. Lett., 2019

Conditional Molecular Design with Deep Generative Models.
J. Chem. Inf. Model., 2019

Efficient learning of non-autoregressive graph variational autoencoders for molecular graph generation.
J. Cheminformatics, 2019

Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis.
Int. J. Distributed Sens. Networks, 2019

Molecular geometry prediction using a deep generative graph neural network.
CoRR, 2019

Approximate training of one-class support vector machines using expected margin.
Comput. Ind. Eng., 2019

2018
Locally linear ensemble for regression.
Inf. Sci., 2018

Product failure prediction with missing data.
Int. J. Prod. Res., 2018

Regression with re-labeling for noisy data.
Expert Syst. Appl., 2018

Personalized prediction of drug efficacy for diabetes treatment via patient-level sequential modeling with neural networks.
Artif. Intell. Medicine, 2018

2017
Reliable prediction of anti-diabetic drug failure using a reject option.
Pattern Anal. Appl., 2017

Ranking process parameter association with low yield wafers using spec-out event network analysis.
Comput. Ind. Eng., 2017

Virtual metrology for copper-clad laminate manufacturing.
Comput. Ind. Eng., 2017

Mining the relationship between production and customer service data for failure analysis of industrial products.
Comput. Ind. Eng., 2017

2015
Improvement of virtual metrology performance by removing metrology noises in a training dataset.
Pattern Anal. Appl., 2015

Constructing a multi-class classifier using one-against-one approach with different binary classifiers.
Neurocomputing, 2015

Optimal construction of one-against-one classifier based on meta-learning.
Neurocomputing, 2015

A novel multi-class classification algorithm based on one-class support vector machine.
Intell. Data Anal., 2015

An efficient and effective ensemble of support vector machines for anti-diabetic drug failure prediction.
Expert Syst. Appl., 2015

Multi-class classification via heterogeneous ensemble of one-class classifiers.
Eng. Appl. Artif. Intell., 2015

2014
Knowledge discovery in inspection reports of marine structures.
Expert Syst. Appl., 2014

Approximating support vector machine with artificial neural network for fast prediction.
Expert Syst. Appl., 2014


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