Stochastic Feed-forward Attention Mechanism for Reliable Defect Classification and Interpretation. - Jiyoon Lee; Chunghyup Mok; Sanghoon Kim; Seokho Moon; Seo-Yeon Kim; Seoung Bum Kim (IntelliSys (1), 2022)

Input-guidance diffusion model for unknown defect patterns detection in wafer bin map. - Seokho Moon; Seoung Bum Kim (Adv. Eng. Informatics, 2025)