A Defect Detection Model for Imbalanced Wafer Image Data Using CAE and Xception. - Jaegyeong Cha; Seokju Oh; Donghyun Kim 005; Jongpil Jeong (IDSTA, 2020)

AnoGAN-Based Anomaly Filtering for Intelligent Edge Device in Smart Factory. - Donghyun Kim 005; Jaegyeong Cha; Seokju Oh; Jongpil Jeong (IMCOM, 2021)

Bearing Fault Diagnosis Based on Multiscale Convolutional Neural Network Using Data Augmentation. - Seungmin Han; Seokju Oh; Jongpil Jeong (J. Sensors, 2021)

A Defect Detection Model for Casting Product using Wavelet Transform Denoise and Xception. - Juyong Park; Seokju Oh; Jongpil Jeong (ICACT, 2022)

Abnormal Data Classification Based on SSA-AELSTM. - Donghyun Kim 005; Seokju Oh; Jeongdae Kim; Jongpil Jeong (ICCSCI, 2023)