A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. - Hyeonchan Lim; Seokjun Jang; Sungho Kang 001 (ISOCC, 2018)

Memory-like Defect Diagnosis for CMOL FPGAs. - Jihye Kim 002; Hayoung Lee; Seokjun Jang; Hogyeong Kim; Sungho Kang 001 (ISOCC, 2020)

Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. - Jihye Kim 002; Hayoung Lee; Seokjun Jang; Sungho Kang 001 (IEEE Access, 2020)

Secure Scan Design through Pseudo Fault Injection. - Seokjun Jang; Hyungil Woo; Sunghoon Kim; Sungho Kang 001 (ISOCC, 2021)

Reconfigurable Scan Architecture for High Diagnostic Resolution. - Seokjun Jang; Jihye Kim 002; Sungho Kang 001 (IEEE Access, 2021)

A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key. - Hyungil Woo; Seokjun Jang; Sungho Kang 001 (IEEE Access, 2021)

Pair-Grouping Scan Chain Architecture for Multiple Scan Cell Fault Diagnosis. - Sunghoon Kim; Seokjun Jang; Youngki Moon; Sungho Kang 001 (ISOCC, 2022)

LOTS: Low Overhead TSV Repair Method Using IEEE-1838 Standard Architecture. - Sunghoon Kim; Donghyun Han; Seokjun Jang; Sungho Kang 001 (ISOCC, 2023)

Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault Diagnosis. - Sunghoon Kim; Seokjun Jang; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

Shift Left Quality Management System (QMS) Using a 3-D Matrix Scanning Method on System on a Chip. - Yong Lee 002; Seokjun Jang; Sungho Kang 001 (IEEE Trans. Circuits Syst. II Express Briefs, 2023)

Low Cost TSV Repair Architecture Using Switch-Based Matrix for Highly Clustered Faults. - Seokjun Jang; Donghyun Han; Sunghoon Kim; Dayoung Kim; Sungho Kang 001 (IEEE Access, 2025)

PASS: Pattern-Sequence-Authentication-Based Secure Scan Against Reverse Engineering Attacks. - Seokjun Jang; Youngki Moon; Duyeon Won; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)

A Novel Prediction-Based Two-Tiered ECC for Mitigating SWD Errors in HBM. - Youngki Moon; Seung Ho Shin; Seokjun Jang; Duyeon Won; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2025)