Electrical Characterization of Nano-Floating Gated Silicon-on-Insulator Memory with In2O3 Nano-Particles Embedded in Polyimide Insulator. - Dong-Uk Lee; Seon Pil Kim; Tae Hee Lee; Eun Kyu Kim; Hyun-Mo Koo; Won-Ju Cho; Young-Ho Kim (IEICE Trans. Electron., 2008)