Yield prediction and validation of onion (Allium cepa L.) using key variables in narrowband hyperspectral imagery and effective accumulated temperature. - Ye Seong Kang; Si Hyeong Jang; Jun Woo Park; Hye Young Song; Chan Seok Ryu; Sae Rom Jun; Seong Heon Kim (Comput. Electron. Agric., 2020)