ATPG for Heat Dissipation Minimization During Scan Testing. - Seongmoon Wang; Sandeep K. Gupta 001 (DAC, 1997)

DS-LFSR: A New BIST TPG for Low Heat Dissipation. - Seongmoon Wang; Sandeep K. Gupta 001 (ITC, 1997)

ATPG for Heat Dissipation Minimization During Test Application. - Seongmoon Wang; Sandeep K. Gupta 001 (IEEE Trans. Computers, 1998)

LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation. - Seongmoon Wang; Sandeep K. Gupta 001 (ITC, 1999)

Generation of Low Power Dissipation and High Fault Coverage Patterns for Scan-Based BIST. - Seongmoon Wang (ITC, 2002)

DS-LFSR: a BIST TPG for low switching activity. - Seongmoon Wang; Sandeep K. Gupta 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)

An automatic test pattern generator for minimizing switching activity during scan testing activity. - Seongmoon Wang; Sandeep K. Gupta 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)

Re-configurable embedded core test protocol. - Seongmoon Wang; Srimat T. Chakradhar; Kedarnath J. Balakrishnan (ASP-DAC, 2004)

Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets. - Seongmoon Wang; Xiao Liu; Srimat T. Chakradhar (DATE, 2004)

Response shaper: a novel technique to enhance unknown tolerance for output response compaction. - Mango Chia-Tso Chao; Seongmoon Wang; Srimat T. Chakradhar; Kwang-Ting Cheng (ICCAD, 2005)

ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values. - Mango Chia-Tso Chao; Seongmoon Wang; Srimat T. Chakradhar; Kwang-Ting Cheng (ICCD, 2005)

XWRC: externally-loaded weighted random pattern testing for input test data compression. - Seongmoon Wang; Kedarnath J. Balakrishnan; Srimat T. Chakradhar (ITC, 2005)

Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage. - Wei Li 023; Seongmoon Wang; Srimat T. Chakradhar; Sudhakar M. Reddy (VLSI Design, 2005)

Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs. - Rajamani Sethuram; Seongmoon Wang; Srimat T. Chakradhar; Michael L. Bushnell (ATS, 2006)

Unknown-tolerance analysis and test-quality control for test response compaction using space compactors. - Mango Chia-Tso Chao; Kwang-Ting Cheng; Seongmoon Wang; Srimat T. Chakradhar; Wenlong Wei (DAC, 2006)

Coverage loss by using space compactors in presence of unknown values. - Mango Chia-Tso Chao; Seongmoon Wang; Srimat T. Chakradhar; Wenlong Wei; Kwang-Ting Cheng (DATE, 2006)

Efficient unknown blocking using LFSR reseeding. - Seongmoon Wang; Kedarnath J. Balakrishnan; Srimat T. Chakradhar (DATE, 2006)

PIDISC: Pattern Independent Design Independent Seed Compression Technique. - Kedarnath J. Balakrishnan; Seongmoon Wang; Srimat T. Chakradhar (VLSI Design, 2006)

A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs. - Seongmoon Wang; Srimat T. Chakradhar (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)

LT-RTPG: a new test-per-scan BIST TPG for low switching activity. - Seongmoon Wang; Sandeep K. Gupta 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)

A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture. - Seongmoon Wang; Wenlong Wei (ASP-DAC, 2007)

A High Compression and Short Test Sequence Test Compression Technique to Enhance Compressions of LFSR Reseeding. - Seongmoon Wang; Wenlong Wei; Srimat T. Chakradhar (ATS, 2007)

SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. - Zhanglei Wang; Krishnendu Chakrabarty; Seongmoon Wang (DATE, 2007)

Unknown blocking scheme for low control data volume and high observability. - Seongmoon Wang; Wenlong Wei; Srimat T. Chakradhar (DATE, 2007)

A hybrid scheme for compacting test responses with unknown values. - Mango Chia-Tso Chao; Kwang-Ting Cheng; Seongmoon Wang; Srimat T. Chakradhar; Wenlong Wei (ICCAD, 2007)

A low cost test data compression technique for high n-detection fault coverage. - Seongmoon Wang; Zhanglei Wang; Wenlong Wei; Srimat T. Chakradhar (ITC, 2007)

Zero Cost Test Point Insertion Technique for Structured ASICs. - Rajamani Sethuram; Seongmoon Wang; Srimat T. Chakradhar; Michael L. Bushnell (VLSI Design, 2007)

A BIST TPG for Low Power Dissipation and High Fault Coverage. - Seongmoon Wang (IEEE Trans. Very Large Scale Integr. Syst., 2007)

Cost Efficient Methods to Improve Performance of Broadcast Scan. - Seongmoon Wang; Wenlong Wei (ATS, 2008)

Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. - Seongmoon Wang; Wenlong Wei (ETS, 2008)

X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors. - Seongmoon Wang; Kedarnath J. Balakrishnan; Wenlong Wei (IEEE Trans. Computers, 2008)

An Efficient Unknown BlockingScheme for Low Control Data Volume and High Observability. - Seongmoon Wang; Wenlong Wei (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)

Machine learning-based volume diagnosis. - Seongmoon Wang; Wenlong Wei (DATE, 2009)

A self-diagnosis technique using Reed-Solomon codes for self-repairing chips. - Xiangyu Tang; Seongmoon Wang (DSN, 2009)

Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip. - Zhanglei Wang; Krishnendu Chakrabarty; Seongmoon Wang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

A Low Hardware Overhead Self-Diagnosis Technique Using Reed-Solomon Codes for Self-Repairing Chips. - Xiangyu Tang; Seongmoon Wang (IEEE Trans. Computers, 2010)

A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support. - Seongmoon Wang; Wenlong Wei; Zhanglei Wang (IEEE Trans. Very Large Scale Integr. Syst., 2010)

An efficient method to screen resistive opens under presence of process variation. - Seongmoon Wang (VTS, 2011)