Low-frequency noise in single-poly bipolar transistors at low base current density. - Nicolas Valdaperez; Jean-Marc Routoure; Daniel Bloyet; Régis Carin; Serge Bardy; Jacques Lebailly (Microelectron. Reliab., 2001)

Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current. - F. Barbier; Fabrice Blanc; A. Le Grontec; R. Colclaser; Theo Smedes; M. Johnson; Serge Bardy; Philippe Descamps (Microelectron. Reliab., 2004)

Size effects on the DC characteristics and low frequency noise of double polysilicon NPN bipolar transistors. - Nicolas Valdaperez; Jean-Marc Routoure; Daniel Bloyet; Régis Carin; Serge Bardy (Microelectron. Reliab., 2005)