Fault Diagnosis in Integrated Circuits with BIST. - Raimund Ubar; Sergei Kostin; Jaan Raik; Teet Evartson; Harri Lensen (DSD, 2007)

Embedded fault diagnosis in digital systems with BIST. - Raimund Ubar; Sergei Kostin; Jaan Raik (Microprocess. Microsystems, 2008)

Block-Level Fault Model-Free Debug and Diagnosis in Digital Systems. - Raimund Ubar; Sergei Kostin; Jaan Raik (DSD, 2009)

Investigations of the diagnosibility of digital networks with BIST. - Raimund Ubar; Sergei Kostin; Jaan Raik (LATW, 2009)

Diagnozer: A laboratory tool for teaching research in diagnosis of electronic systems. - Raimund Ubar; Artur Jutman; Jaan Raik; Sergei Kostin; Heinz-Dietrich Wuttke (MSE, 2009)

Defect-oriented module-level fault diagnosis in digital circuits. - Sergei Kostin; Raimund Ubar; Jaan Raik (DDECS, 2011)

Multiple stuck-at-fault detection theorem. - Raimund Ubar; Sergei Kostin; Jaan Raik (DDECS, 2012)

How to Prove that a Circuit is Fault-Free? - Raimund Ubar; Sergei Kostin; Jaan Raik (DSD, 2012)

About robustness of test patterns regarding multiple faults. - Raimund Ubar; Sergei Kostin; Jaan Raik (LATW, 2012)

Identifying NBTI-Critical Paths in Nanoscale Logic. - Raimund Ubar; Fabian Vargas 001; Maksim Jenihhin; Jaan Raik; Sergei Kostin; Letícia Maria Bolzani Poehls (DSD, 2013)

Synthesis of multiple fault oriented test groups from single fault test sets. - Raimund Ubar; Sergei Kostin; Jaan Raik (DTIS, 2013)

Accurate Dialysis Dose Evaluation and Extrapolation Algorithms During Online Optical Dialysis Monitoring. - Ivo Fridolin; Deniss Karai; Sergei Kostin; Raimund Ubar (IEEE Trans. Biomed. Eng., 2013)

Hierarchical identification of NBTI-critical gates in nanoscale logic. - Sergei Kostin; Jaan Raik; Raimund Ubar; Maksim Jenihhin; Fabian Vargas 001; Letícia Maria Bolzani Poehls; Thiago Santos Copetti (LATW, 2014)

SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic. - Sergei Kostin; Jaan Raik; Raimund Ubar; Maksim Jenihhin; Thiago Copetti; Fabian Vargas 001; Letícia Maria Bolzani Pöhls (DDECS, 2015)

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG. - N. Palermo; Valentin Tihhomirov; Thiago Santos Copetti; Maksim Jenihhin; Jaan Raik; Sergei Kostin; Marco Gaudesi; Giovanni Squillero; Matteo Sonza Reorda; Fabian Vargas 001; Letícia Maria Bolzani Pöhls (LATS, 2015)

A tool set for teaching design-for-testability of digital circuits. - Sergei Kostin; Elmet Orasson; Raimund Ubar (EWME, 2016)

Gate-level modelling of NBTI-induced delays under process variations. - Thiago Copetti; Guilherme Medeiros Machado; Leticia Bolzani Poehls; Fabian Vargas 001; Sergei Kostin; Maksim Jenihhin; Jaan Raik; Raimund Ubar (LATS, 2016)

A novel random approach to diagnostic test generation. - Emmanuel Ovie Osimiry; Raimund Ubar; Sergei Kostin; Jaan Raik (NORCAS, 2016)

Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. - Maksim Jenihhin; Giovanni Squillero; Thiago Santos Copetti; Valentin Tihhomirov; Sergei Kostin; Marco Gaudesi; Fabian Vargas 001; Jaan Raik; Matteo Sonza Reorda; Leticia Bolzani Poehls; Raimund Ubar; Guilherme Cardoso Medeiros (J. Electron. Test., 2016)

A scalable technique to identify true critical paths in sequential circuits. - Raimund Ubar; Sergei Kostin; Maksim Jenihhin; Jaan Raik (DDECS, 2017)

Parallel Critical Path Tracing Fault Simulation in Sequential Circuits. - Jaak Kousaar; Raimund Ubar; Sergei Kostin; Sergei Devadze; Jaan Raik (MIXDES, 2018)

Hierarchical Timing-Critical Paths Analysis in Sequential Circuits. - Lembit Jurimagi; Raimund Ubar; Maksim Jenihhin; Jaan Raik; Sergei Devadze; Sergei Kostin (PATMOS, 2018)

Fast identification of true critical paths in sequential circuits. - Raimund Ubar; Sergei Kostin; Maksim Jenihhin; Jaan Raik; Lembit Jürimägi (Microelectron. Reliab., 2018)