Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C). - Konstantin O. Petrosyants; Igor A. Kharitonov; Sergey V. Lebedev; Lev M. Sambursky; Sergey O. Safonov; Veniamin G. Stakhin (Microelectron. Reliab., 2017)

Comparison of Data-Driven Approaches to Modeling Complex Behavior of 2D Liquid Simulator. - Dmitry Kovalev; Dmitry Khliustov; Sergey O. Safonov (DAMDID/RCDL (Supplementary Proceedings), 2021)

Fast Reservoir Characterization with AI-Based Lithology Prediction Using Drill Cuttings Images and Noisy Labels. - Ekaterina Tolstaya; Anuar Shakirov; Mokhles Mezghani; Sergey O. Safonov (J. Imaging, 2023)