Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C). - Konstantin O. Petrosyants; Igor A. Kharitonov; Sergey V. Lebedev; Lev M. Sambursky; Sergey O. Safonov; Veniamin G. Stakhin (Microelectron. Reliab., 2017)