Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime. - Antonio Raffo; Sergio Di Falco; Giovanna Sozzi; Roberto Menozzi; Dominique M. M.-P. Schreurs; Giorgio Vannini (Microelectron. Reliab., 2011)

Design techniques for high-efficiency microwave power amplifiers. - Sergio Di Falco (2012)