Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays. - Viktor Markov; Gilles Festes; Louisa Schneider; Steven Lemke; Serguei Jourba; Alexander Kotov (IMW, 2023)

Performance and Reliability of Technology Qualified 34 Mb Split-Gate eFLASH Macro in 28 nm HKMG. - Ralf Richter; Stefan Dünkel; Bert Müller; Frank Mauersberger; Sven Wittek; Sven Beyer; Jana Böhme; Uwe Ritter; Violetta Sessi; Zhen Xu; Maximilian Drescher; Jinho Kim; et al. (IMW, 2024)